产品详情

Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Catalog Supply current (max) (µA) 3000
Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Catalog Supply current (max) (µA) 3000
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOP (NS) 16 79.56 mm² 10.2 x 7.8 TSSOP (PW) 16 32 mm² 5 x 6.4
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

下载 观看带字幕的视频 视频
其他器件和数据表

该数据表适用于 CD4511B 和 CD4511B-MIL

您可能感兴趣的相似产品

open-in-new 比较替代产品
功能与比较器件相同,且具有相同引脚
SN74LVC138A 正在供货 3 线至 8 线解码器/多路信号分离器 Smaller voltage range (1.65V to 5.5V), shorter average propagation delay (5.5ns), higher average drive strength (24mA)

技术文档

star =有关此产品的 TI 精选热门文档
未找到结果。请清除搜索并重试。
查看全部 8
类型 标题 下载最新的英语版本 日期
* 数据表 CMOS BCD-to-7-Segment Latch Decoder Drivers 数据表 (Rev. B) 2003年 6月 27日
选择指南 Logic Guide (Rev. AB) 2017年 6月 12日
应用手册 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
用户指南 Signal Switch Data Book (Rev. A) 2003年 11月 14日
应用手册 Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001年 12月 3日

设计和开发

如需其他信息或资源,请点击以下任一标题进入详情页面查看(如有)。

评估板

14-24-LOGIC-EVM — 采用 14 引脚至 24 引脚 D、DB、DGV、DW、DYY、NS 和 PW 封装的逻辑产品通用评估模块

14-24-LOGIC-EVM 评估模块 (EVM) 设计用于支持采用 14 引脚至 24 引脚 D、DW、DB、NS、PW、DYY 或 DGV 封装的任何逻辑器件。

用户指南: PDF | HTML
英语版 (Rev.B): PDF | HTML
TI.com 上无现货
参考设计

TIDA-00480 — 汽车类霍尔传感器旋转编码器

这是一种增量式旋转编码器,使用非接触式磁性感应来检测旋转速度和方向。两个霍尔效应传感器可测量 66 极环形磁体并输出两个正交信号。此汽车级解决方案具有低成本特点,由于使用固态检测,不受物理磨损、污垢、腐蚀和射频噪声的影响,因此是用于取代常规机械接触式编码器的高可靠性产品。
用户指南: PDF
原理图: PDF
封装 引脚 CAD 符号、封装和 3D 模型
PDIP (N) 16 Ultra Librarian
SOP (NS) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

视频